| OhmRef
Overview Making resistance measurements with OhmRef is as simple as clicking on resistors from your list and selecting your choice of test methods. OhmRef will create a test design for up to eight resistance devices and control your multimeter, Low Thermal Scanner and source to take the measurements. When all the readings have been taken you can print a complete analysis, save the results and create graphs of the data. OhmRef accommodates any resistance value between 100mW and 10GW with comparison accuracy better than 1 ppm for resistor values between 1W and 10MW. |
Flexibility OhmRef provides a convenient means to set up a measurement. Scanner connections and traceable values can be saved, so you simply select the resistors to test. It only takes a few seconds to add new resistors that come into your laboratory for calibration. Information for up to 100 resistors can be stored. OhmRef has built in drivers to accommodate suitable multimeters and sources. Reports and Graphs A complete analysis of the test can be printed. Various graphs can be made to monitor your resistors. |
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OhmRef allows you to select between four test methods depending upon the resistance level, required accuracy, and equipment available in your laboratory. The first and most basic method requires only the Low Thermal Scanner and ohmmeter. All methods take advantage of equipment thats commonly available in standards laboratories, providing very good accuracy at a low cost. Statistical Analysis OhmRef creates a test design to compare resistors |
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Add control limits to your graphs for statistical control with the click of a mouse. Historical data can be edited in OhmRef or exported to popular spreadsheet programs. Drift RatesOhmRef computes the least-squares, straight-line slope of your resistors. This aids you in predicting the drift for your standards. Also the predicted slope and calibration date can be stored for each traceable unit. This information can be used to calculate the predicted values for your traceable resistors each time a test is run. |
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in pairs. Each resistor in the pair is measured, one at a time, and the difference between the two units is saved. When all the measurements are complete OhmRef computes a least-squares-fit to determine the value for each device. This value is based on the average value of the reference units included in the test. A standard deviation of the measurement is also computed. The designs and computations used are similar to those re- commended by NIST developed for voltage calibrations. |
System Requirements Computer, 486 or higher, with 8 Mbytes of RAM (12 Mbytes recommended) Windows® 3.1/ 95 / NT, and a IEEE-488 (GPIB) bus interface card (not included), a Data Proof Low Thermal Scanner and suitable multimeter. (OhmRef runs in TransEras HWIN with Basic PLUS - runtime versions are included. HWIN Development version is also available to edit OhmRef program code.) Recommended: Suitable source(s); methods 2,3 & 4 |
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